Microscopy Start Here
A beginner-first path through optical microscopy, SEM, TEM, AFM and STM with acronym decoding, instrument anatomy, physics, workflows and artifact tests.
Interactive lab
This page is a live simulation rather than a written lesson: enable JavaScript to use its controls, visualizations, and code traces. The written lessons for this subject are linked below.
More in Micro & Nano
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- TEMElectron-transparent samples, diffraction, grain boundaries and beam damage.
- SEMElectron beam, secondary/backscattered electrons, charging and working distance.
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- SEM vs TEM vs AFMA shared MEMS sample explored through surface morphology, internal structure and 3D topography.
- XRDBragg peaks, phase identification, broadening, texture and strain.
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- Four-Point ProbeSheet resistance, resistivity, geometry and edge corrections.